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BSTJ 35: 5. September 1956: The Use of an Interference Microscope for Measurement of Extremely Thin Surface Layers. (Bond, W.L.; Smits, F.M.)

Publication date: 1956-09

Collection: bstj-archives; magazine_rack; additional_collections; sciencemagazines

Language: English

Bell System Technical Journal, 35: 5. September 1956 pp 1209-1221. The Use of an Interference Microscope for Measurement of Extremely Thin Surface Layers. (Bond, W.L.; Smits, F.M.)

Addeddate: 2013-01-19 04:33:16

Identifier: bstj35-5-1209

Identifier-ark: ark:/13960/t9k374078

Ocr: ABBYY FineReader 8.0

Ppi: 200

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Uploaded by Sketch the Cow on January 19, 2013

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